|
| |
 Research
highlights
 | Negative-Index Material (NIM)
amplitude and phase measurements at X-band (Qin Chao, Jill Pamperin, Andrew Houck,
I. Chuang, D.W. van der Weide) |
| High Aspect Ratio (HAR)
tips for near-field microwave probing (Yaqiang Wang, Guoqing Ning,
Sharmila Rajendran, D.W. van der Weide) |
|
Molded polystyrene cantilevers for low-force Atomic Force Microscopy (AFM)
(Charles Paulson, Andrew Stevens, D.W. van der Weide) |
|
Subwavelength imaging (Z. Lu, D. Prather) |
| Microwave
tweezers (Z. Lu, D. Prather) |
|
Negative refraction in left-handed media (I. Mirza, D. Prather) |
| Photonic
crystal NSOM probe tips (G. Schneider, J. Murakowski, D. Prather) |
|
